Download Advances in X-Ray Analysis: Volume 9 Proceedings of the by F. W. Young Jr., T. O. Baldwin, A. E. Merlini, F. A. PDF

By F. W. Young Jr., T. O. Baldwin, A. E. Merlini, F. A. Sherrill (auth.), Gavin R. Mallett, Marie J. Fay, William M. Mueller (eds.)

ISBN-10: 1468476351

ISBN-13: 9781468476354

The papers awarded during this quantity of Advances in X-Ray research have been selected from these offered on the Fourteenth Annual convention at the purposes of X-Ray research. This convention, subsidized by way of the Metallurgy department of the Denver examine Institute, collage of Denver, used to be hung on August 24,25, and 26, 1965, on the Albany lodge in Denver, Colorado. Of the fifty six papers awarded on the convention, forty six are incorporated during this quantity; additionally incorporated is an open dialogue hung on the results of chemical com­ bination on X-ray spectra. the topics offered characterize a vast scope of functions of X-rays to a number of fields and disciplines. those incorporated such fields as electron-probe microanalysis, the influence of chemical mix on X-ray spectra, and the makes use of of soppy and ultrasoft X-rays in emission research. additionally integrated have been periods on X-ray diffraction and fluor­ escence research. there have been numerous papers on particular subject matters, together with X-ray topography and X-ray absorption fine-structure research. William L. Baun contributed massive attempt towards the convention by way of organizing the consultation at the impact of chemical blend on X-ray spectra nice constitution. a different consultation was once confirmed throughout the first-class efforts of S. P. Ong at the makes use of and applica­ tions of sentimental X-rays in fluorescent research. we provide our honest due to those males, for those targeted classes contributed drastically to the good fortune of the conference.

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Additional info for Advances in X-Ray Analysis: Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25–27, 1965

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K. Howard: The scanning or counting time necessary to examine variations in composition over 1 in. diameter deposits would seem impractical. The gross inhomogeneity over large area deposits is easily identified in the X-ray topographs. The axial variations in composition can also be investigated with X-ray topography. The slice is cleaved perpendicular to the slice surface to expose a {11 O} plane; an X-ray topograph of the surface will display the compositional variations. T. E. Reichard (Monsanto Company): I have a related question I was going to ask.

When the substrate is processed (sawed, lapped, polished), an expedient method to mark individual slices for identification consists of scratching anumber on the (111 )-A side with a diamond scribe. A (333) topograph (Figure 4) of a polished (111 )-B face clearly reveals the number "9" which had been lightly scribed on the opposite side. 025 in. This effect has been termed "kinking" by Renniger15 and results in angular distortions of the atomic planes near the disturbance. Intense straining in the vicinity of the "9" image deforms the atomic planes to such an extent that diffraction does not occur in this region (arrow).

K. Howard and R. H. Cox 39 Figure 3. The (440) topograph of a dislocation array in GaAs substrate material. Figure 4. Evidence of scribe damage which propagated through 25 mils of GaAs. The diffracting planes are strained in the vicinity of the violation (arrow). Epitaxial Film Perfection The homogeneity and single crystallinity of the Ga(As, P) deposit are of optimum concern in the evaluation of film perfection. The dislocation density of the deposit is of lesser importance to device parameters.

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